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Toplam kayıt 145, listelenen: 141-145
Polarized-beam high-energy EDXRF in geological samples
(0-Belirlenecek, 2013)
Certified reference materials (NIST 1645, BCR 143, IAEA 7, BCR 141, NIES-CRM-02, and IAEA 375) were used for determining the performance of a secondary target energy-dispersive X-ray fluorescence (EDXRF) spectrometer, ...
Determination of trace elements in ashes of milk samples by using XRF technique
(Chemical Publishing Co., 2013)
Energy dispersive X-ray fluorescence system has been used to determine the heavy metal ions present in cow's milk. Samples have been collected from farm and markets within the border of Kahramanmaras province, Turkey. An ...
The effect of external electric field on mass attenuation coefficients of some semiconductor
(Taylor and Francis Inc., 2014)
In this study, we measured the mass attenuation coefficient of n-type GaAs, p-type GaAs, n-type Si and Au/n-Si/n+Si/Al samples with and without external electric field. Samples were set in perpendicular direction to the ...
Synthesis and fabrication of Mg-doped ZnO-based dye-synthesized solar cells
(Springer, 2014)
Undoped and 2, 4 and 6 at.% Mg-doped ZnO nanorods were successfully deposited on ZnO seeded fluorine tin oxide substrates by a simple chemical bath deposition technique to form a photoanode. It was seen that all the samples ...
Differential inelastic scattering cross-section of silicon and gallium arsenide semiconductor crystals
(Chemical Publishing Co., 2016)
Because of the extensive usage of silicon and gallium arsenide semiconductor crystals, the differential inelastic scattering cross-sections at 59.5 keV have been measured for various scattering angles changing from 120 to ...